섬유

combining in-circuit and functional testing

  • 출판일1999.03
  • 저자
  • 서지사항
  • 등록일 2016.11.02
  • 조회수 339
in-circuit testers, originally conceived to test for and isolate manufacturing defects and assembly faults on loaded p/c boards, are now incorporating test capabilities formerly assigned to functional testers. the latest systems, in addition to testing for shorts, opens, and components that are missing, wrong, backward, defective or out of tolerance, can now statically and dynamically check digital logic networks and employ stimulus/response tests to analog circuits. lsi circuits can be dynamically exercised and evaluated by extending the technique known as signature analysis added programming complexity is viewed as the major deterrent to the wider use of combined systems
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