섬유

xps/sem characterization of surface-treated carbon fibres

  • 출판일1999.03
  • 저자
  • 서지사항
  • 등록일 2016.11.02
  • 조회수 299
chemical characterization of the carbon fiber (cf) is conveniently accomplished by coupling two of the most widely used techniques in the field of cf analysis: x-ray photoelectron spectroscopy (xps) and scanning electron microscopy (sem) preliminary results showed that cf are a special challenge to xps spectroscopists since the analysis involves evaluation of the content of oxidized carbon species present at low concentrations on the cf surface and give origin to minor signals overlapped to the skewed left-hand side of the major, asymmetrical c 1s graphitic peak. 6 refs
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