비의류제품

international test conference 1985 proceedings. the future of test (cat. no.85ch2230-1)

  • 출판일1999.03
  • 저자
  • 서지사항
  • 등록일 2016.11.02
  • 조회수 448
the following topics are dealt with' test economics: test generation: input stimulus generation for built-in self-testing: systems testing: calibration and timing accuracy of test equipment: test technology in the university: automatic test program generation: nontraditional board testing: vlsi test systems: memory testing: design verification: quality/reliability: design for testability: board testing and chip probing: tester interfaces: debug tools: test software standards: logic simulation: microprocessors: simulation models: analog devices: artificial intelligence: p/c boards: and ic processing. 148 papers were presented, all of which are published in full in the present proceedings. abstracts of individual papers can be found under the relevant classification codes in this or other issues
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